
Advanced lecture on Nuclear Safety regulation(3)
On Air
The formation of defects in semiconductor crystals is an important factor that determines device performance, and accurate identification of defects is essential for improving performance. In this lecture, we will discuss electron spin resonance (EPR) as a powerful method for identifying defects, and explain the study on defects in combination with density functional theory (EFT) simulations, by taking several specific examples. The main topics to be covered in the lecture are as follows. (This lecture will be given in English.)
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