Subject | Engineering

  • Learning

Summer Lecture 2025_Nanotechnology III

The formation of defects in semiconductor crystals is an important factor that determines device performance, and accurate identification of defects is essential for improving performance. In this lecture, we will discuss electron spin resonance (EPR) as a powerful method for identifying defects, and explain the study on defects in combination with density functional theory (EFT) simulations, by taking several specific examples. The main topics to be covered in the lecture are as follows. (This lecture will be given in English.) This video will be released exclusively to University of Tsukuba students. If you are a student at the University of Tsukuba, the video will be sent via a dedicated video site. Please contact us with your student ID number.

Content/学習内容

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    Staff/スタッフ

      • Teacher
      Serge Gambarell
      CEA-CNRS-UGA-Grenoble-INP
      Doctor
      • Teacher
      Jean-Marie Mouesca
      CEA-CNRS-UGA-Grenoble-INP
      Doctor
      • Operation
      Inter-University Exchange Project (EU) Office
      Inter-University Exchange Project (EU) Office

    Competency/コンピテンシー

    • Language proficiency

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